Surface Engineering, Analysis, and Consulting
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Quick Link to Surface Analysis Techniques
Auger Electron Spectroscopy (AES) X-Ray Photoelectron Spectroscopy (XPS, ESCA) X-Ray Diffraction (XRD) Secondary Ion Mass Spectrometry (TOF-SIMS) Electron Microscopy |
Electron Backscatter Diffraction (EBSD)Electron backscatter diffraction (EBSD) is a technique used to examine the crystallographic structure of polished samples. It can be used to determine grain size, crystal orientation and phase identification of metallic samples. Used in combination with EDS, the microstructure of metallic samples can be thoroughly characterized. Using image processing, the fraction of each phase can be measured. EBSD is generally an option for field emission scanning electron microscopes. Because localized surface strain alters crystallographic structure, polished samples must be of high quality. Electron backscatter diffraction (EBSD) phase identification. The fraction of each phase is included.  Electron backscatter diffraction (EBSD) – Nickel Alloy   Color coded orientation map    Grain size determination - Histogram and map highlighted according to grain size.
 Stainless Steel 316 Weld   Grain shape aspect ratio chart and highlighted map. Elongated grains colored blue/green and more equiaxed grains colored yellow/red.
Microscopy & Diffraction
Optical Microscopy & Sample Preparation Scanning Electron Microscopy/Energy Dispersive Spectroscopy Electron Backscatter Diffraction | Transmission Electron Microscopy | X-Ray Diffraction Back to Analytical Services |
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