Electron Microscopy, Field Emission Electron Microscopy, Milwaukee Electron Microscopy

ELECTRON MICROSCOPY	Home : Electron Microscopy

Electron Microscopy is often the first screening technique used for material investigations, both traditional tungsten-filament scanning electron microscopy and highest quality field-emission electron microscopy are available. Full metallurgical sample preparation facilities are available.

Traditional scanning electron microscopy: Light element detection with energy dispersive spectroscopy
60Å resolution

Backscattered electron imaging

Field emission scanning electron microscopy: Digital imaging

15Å resolution

Light element detection with energy dispersive spectroscopy, including nitrogen

Automated particle analysis related to particle composition

Surface & Material Analysis:
Auger Electron Spectroscopy (AES) | X-Ray Photoelectron Spectroscopy (XPS)
X-Ray Diffraction (XRD) | Secondary Ion Mass Spectroscopy (SIMS)
Electron Microscopy