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COMPARISON OF ANALYSIS METHODS
Auger Electron Spectroscopy, X-Ray Photoelectron Spectroscopy, Energy/ Wavelength Dispersive Spectroscopy
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Home : Comparison of Analysis Methods
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| Technique |
Auger Electron Spectroscopy |
X-Ray Photoelectron Spectroscopy |
Energy/ Wavelength Dispersive Spectroscopy |
| Abbreviation |
AES |
XPS or ESCA |
EDS/WDS |
| Primary Excitation |
Electron |
X-Ray |
Electron |
| Detected Secondary |
Auger Electron |
Photoelectron |
X-Ray |
| Elemental Range |
3-92 |
2-92 |
5-92 |
| Lateral Resolution |
200 Å |
10 µm |
1 µm |
| Detected Depth |
30 Å |
30 Å |
1 µm |
| Detection Limit |
1% |
1% |
0.1% |
| Quantitative? |
Semi |
Semi |
Yes |
| Accuracy ± |
30% |
30% |
10% |
| Depth Profile? |
Yes |
Yes |
No |
| Analyze Insulator |
No |
Yes |
Yes |
| Identify Organics? |
No |
Some |
No |
| Chemical State ID? |
Some |
Yes |
No |
| Technique |
X-Ray Fluorescence |
X-Ray Diffraction |
Secondary Ion Mass Spectrometry, Dynamic |
Time - of - Flight SIMS, Static |
| Abbreviation |
XRF |
XRD |
SIMS |
TOF-SIMS |
| Primary Excitation |
X-Ray |
X-Ray |
Ions |
Ions |
| Detected Secondary |
X-Ray |
X-Ray |
Substrate ions |
Substrate ions |
| Elemental Range |
6-92 |
Crystalline materials |
1-92 |
1-92 |
| Lateral Resolution |
1 cm |
30 µm |
60 µm |
1500 Å |
| Detected Depth |
Bulk |
0.1-10 µm |
0-10 µm |
15 Å |
| Detection Limit |
ppb |
1% |
ppm |
0.01% |
| Quantitative? |
Yes |
Semi |
Yes |
Semi |
| Accuracy ± |
10% |
10% |
30% |
100% |
| Depth Profile? |
No |
Yes, with angles |
yes |
No |
| Analyze Insulator |
Yes |
Yes |
Yes |
Yes |
| Identify Organics? |
No |
Some crystalline |
No |
Yes |
| Chemical State ID? |
No |
Yes |
No |
Molecular
species |
| Technique |
Fourier Transform Infrared |
Raman Microprobe |
Atomic Force/ Scanning Tunnelling Microscope |
| Abbreviation |
FTIR |
Raman |
AFM/STM |
| Primary Excitation |
IR radiation |
Laser |
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| Detected Secondary |
IR radiation |
Photons |
Surface Topography |
| Elemental Range |
NA |
NA |
NA |
| Lateral Resolution |
10-100 µm |
2 µm |
<0.1 Å |
| Detected Depth |
20 Å-1µm |
0.2-10 µm or more if transparent |
0.1 Å (vertical resolution) |
| Detection Limit |
ppm |
0.1% |
NA |
| Quantitative? |
Yes |
Poor |
NA |
| Accuracy ± |
5% |
100% |
1-2 Å |
| Depth Profile? |
Yes |
Variable |
No |
| Analyze Insulator |
Yes |
Yes |
Yes |
| Identify Organics? |
Yes |
Yes |
No |
| Chemical State ID? |
Chemical Bond Information |
Molecular species |
No |
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