Surface Engineering, Analysis, and Consulting
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Quick Link to Surface Analysis Techniques
Auger Electron Spectroscopy (AES) X-Ray Photoelectron Spectroscopy (XPS, ESCA) X-Ray Diffraction (XRD) Secondary Ion Mass Spectrometry (TOF-SIMS) Electron Microscopy |
Optical Microscopy & Sample PreparationInitial inspections are conducted with optical microscopy. Full metallographic polishing capabilities are available if necessary for your project.  
Microscopy & Diffraction
Optical Microscopy & Sample Preparation Scanning Electron Microscopy/Energy Dispersive Spectroscopy Electron Backscatter Diffraction | Transmission Electron Microscopy | X-Ray Diffraction Back to Analytical Services |
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