 |
Surface Engineering, Analysis, and Consulting |
|
News & Resources
Return to main listing
Technical Articles - Applied Surface Analysis Archives
|
Comparison of XPS and XRD - Background [Updated: 08/20/2005] [Filesize: 56K]
X-ray photoelectron spectroscopy (XPS) and x-ray diffraction (XRD) are often used to analyze the surface of complex oxide materials. When XRD is used in an angle resolved x-ray diffraction mode, crystalline composition as a function of depth can be obtained. Similarly, when XPS is used in conjunction with argon depth profiling, composition as a function of depth can also be obtained. A review of the two techniques is included, comparing and contrasting their ability to obtain chemical information as a function of depth for heterogeneous oxide layers.
|
|
Evidence of Hydrogen with XPS Analysis [Updated: 08/19/2005] [Filesize: 111K]
Although H is not detected directly with x-ray photoelectron spectroscopy (XPS), one can often detect shifting of other XPS peaks due to the presence/absence of hydrogen. While not a complete review paper, this work presents XPS shifting patterns with the intent to evolve a series of covalency/ionicity arguments to help explain the progressive, periodic changes in XPS peak locations for common cases such as M-O-H- and M-N-H- containing systems, followed by lesser shifts exhibited by metal and metalloid hydrides, including organic bonding.
|
|
Interfacial Chemistry in AlTi /Graphite Systems [Updated: 03/20/2005] [Filesize: 1,057K]
The chemical and physical interaction of liquid metal surfaces with various substrates is an important, largely unexplored aspect of technology, with implications in composite science and catalysis. In the present case, we have employed x-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), in conjuction with sessile drop wettability tests, to examine the interfacial properties and surface chemistry of the systems formed by adding liquid drops of select Al-Ti alloys to graphite substrates. A variety of different chemical states was revealed by XPS, suggesting the formation of alloys and carbides.
|
|
SEM/EDS of Submicrometer Flyash [Updated: 02/25/2005] [Filesize: 1,946K]
Scanning electron microscopy and energy dispersive spectroscopy (SEM/EDS) were used to analyze two groups of submicrometer coal flyash from specific eastern and western power plants. The composition of the particles could be related to the composition of the coal that was used. The power plant using the higher sulfur concentration eastern coal produced ash containing 1.5% SO2 equivalent.
|
|
|
 |