Surface Engineering, Analysis, and Consulting
Analytical Services
Quick Link to Surface Analysis Techniques
Auger Electron Spectroscopy (AES)
X-Ray Photoelectron Spectroscopy (XPS, ESCA)
X-Ray Diffraction (XRD)
Secondary Ion Mass Spectrometry (TOF-SIMS)
Electron Microscopy
Analytical Services
Surface Analysis
X-Ray Photoelectron Spectroscopy (XPS, ESCA)
Auger Electron Spectroscopy (AES)
Time-of-Flight Secondary Ion Mass Spectrometry (Static) (TOF-SIMS)
Dynamic Secondary Ion Mass Spectrometry (D-SIMS)
Additional techniques
Microscopy & Diffraction
Optical Microscopy & Sample Preparation
Scanning Electron Microscopy/Energy Dispersive Spectroscopy (SEM/EDS)
Electron Backscatter Diffraction (EBSD)
Transmission Electron Microscopy (TEM)
X-Ray Diffraction (XRD)
Organic Material Analysis
Fourier Transform Infrared Analysis (FTIR)
Gas Chromatography/Mass Spectrometry (GC/MS)
Wet Chemistry
Comparison of Analysis Methods
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