STAINLESS STEEL ANALYSIS
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Material Interface has developed a series of protocols for the analysis of stainless steel. Surface composition is obtained in addition to metal/oxide ratios for chromium and iron. To measure the level of passivation, the composition as a function of depth can be determined for major elements present as well as for minor elements such as silicon. In addition, both Auger and XPS (ESCA) methods of stainless steel analysis via the Sematech ** specifications are available.

The left figure shows the concentration as a function of depth of O, Cr, and Fe of mechanically polished 316L; the right figure illustrates the effect of passivation on the near-surface Cr/Fe ratio.

**Sematech, 2706 Montopolis Drive, Austin, TX 78741, Specifications 901 20403B-STD and 91060573B-STD www.sematech.org



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