SURFACE ANALYSIS, MATERIAL ANALYSIS
 Home : Surface Analysis, Material Analysis

Single layers of surface atoms influence bonding and wettability. Corrosion resistance, lubrication, and electrical contact are a function of the composition of the first 100 atom layers. A variety of surface spectroscopies exist that can aid in the characterization of your components. These include:

  1. Auger electron spectroscopy (AES)
  2. X-ray photoelectron spectroscopy (XPS, also known as ESCA)
  3. X-Ray Diffraction (XRD)
  4. Secondary ion mass spectrometry (SIMS)
  5. Electron Microscopy

After consultation, various techniques will be implemented. Interpretive reports are included.

Client Solutions:
  1. AES identified discoloration on stainless steel as a manganese oxide layer formed due to improper heat treatment.
  2. XPS with argon profiling was used to determine the depth of passivation of stainless steel and the oxidation state of chromium and iron.
  3. FTIR concluded that a polystyrene film caused high resistance on electrical contacts.
  4. TOF-SIMS demonstrated silicone contamination on glass as a cause for coating delamination.



N73W22301 Willowview Drive   Sussex, Wisconsin 53089-2244
Phone (262) 246-9610    Fax (262) 246-9670




Copyright © Material Interface Inc. | All Rights Reserved Privacy Statement
Website Design, Production, Programming, Hosting and Marketing by OnYourMark, LLC