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AUGER ELECTRON SPECTROSCOPY (AES)	Home : Surface Analysis, Material Analysis : Auger Electron Spectroscopy (AES)

Surface analysis techniques such as Auger electron spectroscopy (AES) are used for product development and quality control.

State-of-the-art AES is available featuring:

• 10-50Å analysis depth
• 100Å spatial resolution
• In-situ fracture analysis
• Heated/cooled stage
• Large sample size
• Color maps and line scans
• Depth profiling

Grain Boundary Particle Analysis
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Steel Fracture Surface Secondary electron image, 10,000X	Auger Images - Fe, Sb, Cr AES identified the composition of grain boundary particles to be Sb and Cr. These phases resulted in the embrittlement of an aged steel rotor.

Surface & Material Analysis:
Auger Electron Spectroscopy (AES) | X-Ray Photoelectron Spectroscopy (XPS)
X-Ray Diffraction (XRD) | Secondary Ion Mass Spectroscopy (SIMS)
Electron Microscopy

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