X-Ray Photoelectron Spectroscopy (XPS), ESCA, Surface Spectroscopy, Material Spectroscopy

X-RAY PHOTOELECTRON SPECTROSCOPY (XPS, ESCA)	Home : Surface Analysis, Material Analysis : X-Ray Photoelectron Spectroscopy (XPS, ESCA)

The surface analysis technique called X-Ray Photoelectron Spectroscopy (XPS) is used for chemical identification of surface species. XPS options include:: 10-50Å analysis depth

10µm spatial resolution

Mapping

Depth profiling

Large sample size

Dental Alloy Analysis

XPS was used to analyze the oxidation state of palladium in dental alloys at the surface and at depths of 30Å, 100Å, and 1000Å. Using the data, the mechanism of oxide growth was theorized. As a result, new, lower cost alloys were designed.

Surface & Material Analysis:
Auger Electron Spectroscopy (AES) | X-Ray Photoelectron Spectroscopy (XPS)
X-Ray Diffraction (XRD) | Secondary Ion Mass Spectroscopy (SIMS)
Electron Microscopy