- XRD analyzes crystal plane spacing to identify chemical compounds and measure stresses in materials.
- 30 µm spatial resolution
- Variable analysis depth (from a few hundred Angstroms to several tens of micrometers) by varying the incident angle of the x-ray source or by changing the anode.
- Preferred orientation
- Residual stress
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Polymer Analysis
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The degree of crystallinity of a polypropylene fiber was determined as a function of annealing time with XRD. Differences were correlated to tensile strengths and elasticity data.
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Phase Identification
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XRD was used to identify the phases present in a Pd Ga alloy.
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Surface & Material Analysis:
Auger Electron Spectroscopy (AES) | X-Ray Photoelectron Spectroscopy (XPS)
X-Ray Diffraction (XRD) | Secondary Ion Mass Spectroscopy (SIMS)
Electron Microscopy
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