Surface Engineering, Analysis, and Consulting
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Quick Link to Surface Analysis Techniques
Auger Electron Spectroscopy (AES) X-Ray Photoelectron Spectroscopy (XPS, ESCA) X-Ray Diffraction (XRD) Secondary Ion Mass Spectrometry (TOF-SIMS) Electron Microscopy |
Transmission Electron Microscopy (TEM)TEM is the ideal method for the inspection of nanoparticle size and structure. The image below illustrates monodispersed oxide particles with a size range from 10-30 nm. High resolution TEM is used to determine lattice parameters. 
Microscopy & Diffraction
Optical Microscopy & Sample Preparation Scanning Electron Microscopy/Energy Dispersive Spectroscopy Electron Backscatter Diffraction | Transmission Electron Microscopy | X-Ray Diffraction Back to Analytical Services |
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