Surface Analysis

Typical XPS projects include surface segregation, corrosion, semiconductor & electrical contact contamination, surface cleanliness, paint & coating delamination, and intergranular fracture. Material issues analyzed with Auger include surface & grain boundary segregation, surface cleanliness, corrosion, semiconductor and electrical contact contamination, and small area analysis. Generally used for very specific organic material identification, TOF-SIMS studies include polymer curing & surface segregation, surface cleanliness and silicone analysis. Dynamic secondary ion mass spectrometry (D-SIMS) is used to quantitatively determine changes in composition as a function of depth of inorganic materials. Atomic force microscopy (AFM) Surface energy & contact angle determination Surface roughness Coating adhesion testing Nanohardness