Typical XPS projects include surface segregation, corrosion, semiconductor & electrical contact contamination, surface cleanliness, paint & coating delamination, and intergranular fracture.
Material issues analyzed with Auger include surface & grain boundary segregation, surface cleanliness, corrosion, semiconductor and electrical contact contamination, and small area analysis.
Generally used for very specific organic material identification, TOF-SIMS studies include polymer curing and surface segregation, surface cleanliness and silicone analysis.
Dynamic Secondary Ion Mass Spectrometry (D-SIMS)
Atomic force microscopy (AFM)
Surface energy & contact angle
Coating adhesion testing