Surface Engineering, Analysis, and Consulting
Analytical Services
: Microscopy & Diffraction
Quick Link to Surface Analysis Techniques
Auger Electron Spectroscopy (AES)
X-Ray Photoelectron Spectroscopy (XPS, ESCA)
X-Ray Diffraction (XRD)
Secondary Ion Mass Spectrometry (TOF-SIMS)
Electron Microscopy
Microscopy & Diffraction
Optical Microscopy & Sample Preparation
Scanning Electron Microscopy/Energy Dispersive Spectroscopy (SEM/EDS)
Electron Backscatter Diffraction (EBSD)
Transmission Electron Microscopy (TEM)
X-Ray Diffraction (XRD)